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Información tecnológica

On-line version ISSN 0718-0764

Abstract

ALVES, Marcelo L; FERREIRA, Bruno B  and  LETA, Fabiana R. Evaluation of Roughness Parameters using Image Analysis from Different Optical and Electronic Microscopes . Inf. tecnol. [online]. 2011, vol.22, n.4, pp.129-146. ISSN 0718-0764.  http://dx.doi.org/10.4067/S0718-07642011000400014.

A methodology for analyzing the roughness based on surface characteristics of the images obtained from optical and electronic microscopes, is presented. The features that describe textures and are also used to classify them derive from the Haralick descriptors, which are based on co-occurrence matrices. The primary roughness patterns are evaluated and classified according to several features which use the values of these descriptors. The values extracted from the patterns are fed to artificial neural network of the multi-layer perceptron type. It is concluded that it is possible to start implementing the control of metal parts for industrial quality control of manufactured products through this system of roughness recognition.

Keywords : roughness; textural descriptors; neural networks; pattern recognition.

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